inProbe: Smart Product Routing
Wafer level yield prediction
inProbe provides automated yield prediction to recognize, monitor and report yield loses before probing. The model is used to determine whether any of the wafers have higher yield than a wafer yield threshold and can be skipped from the next testing.
Minimal total cost
The yield threshold is optimized to minimize the total cost of Unit Probe + Assembly and to significantly save required Unit Probe capacity. The total cost optimization is based on our unique solution.
Real time prediction integrated in MES or batch mode predictions.